Abstract

The unique photoelectric properties of phosphorene typically include anisotropy, hence the nondestructive and rapid identification of its crystal orientation is a key point to the investigation and application of phosphorene. Currently, the orientation identification by analyzing the Ag1 mode based on parallel-polarized Raman has severe requirements for the applicable Raman system. Therefore, it is necessary to develop a more general, convenient, and accurate method for determining the crystal orientation of phosphorene. In this paper, a method of orientation identification was proposed by using a Raman system without an analyzer and quantifying the correlation between the intensities of Ag1 and Ag2 modes with the change of the incident polarization direction. By using mechanically peeled phosphorene as specimens, Raman measurements were carried out under the Raman configurations of both parallel polarization and with no analyzer. The results show that the crystal orientation of phosphorene can be accurately identified by quantifying the Raman intensities of both Ag1 and Ag2 modes using the Raman system without an analyzer.

Highlights

  • Monolayer or few-layer black phosphorus is generally called phosphorene [1], which is a typical two-dimensional (2D) material

  • Accurate, and rapid identification of its crystal orientation is a key point to the investigation and application of phosphorene [12]

  • For the identification of the crystal orientation of phosphorene, the existing methods mainly include microscopic observation based on TEM and AFM, angle-resolution electric conductivity, and spectroscopy methods such as infrared and Raman

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Summary

Introduction

Monolayer or few-layer black phosphorus is generally called phosphorene [1], which is a typical two-dimensional (2D) material. Compared with graphene [2], transition-metal sulphides, and other 2D materials [3] phosphorene has unique properties in acoustics [4], optics [5], thermotics [6], electrics [7,8], and mechanics [9,10], which are usually anisotropic, viz. These properties, especially owing to their anisotropy, prospectively make phosphorene a kernel material of microelectronic and optoelectronic devices of the new generation [11]. Accurate, and rapid identification of its crystal orientation is a key point to the investigation and application of phosphorene [12]. For the identification of the crystal orientation of phosphorene, the existing methods mainly include microscopic observation based on TEM and AFM, angle-resolution electric conductivity, and spectroscopy methods such as infrared and Raman.

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