Abstract
Two variants of CuPt B-type orderings in strained Cd x Zn 1− x Te epilayers were investigated by using transmission electron microscopy (TEM) and selected area diffraction pattern (SADP) measurements. The TEM images on the Cd 0.15Zn 0.85Te epilayers depicted strong contrast modulations along the [110] direction, and the SADP images showed superstructure reflection spots corresponding to a CuPt B-type ordering. Possible crystal structures for the two variants of CuPt B-type ordering in the Cd x Zn 1− x Te epilayers, which were determined from the SADP images, are presented.
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