Abstract
Cu-Se and Ag-Te crystals which grew by solid-solid reactions of vacuum-deposited metal and chalcogen films were investigated with a JEM 200-CX electron microscope (Cs= 1.2 mm), with the aid of image simulation and optical diffraction.Fig. 1 shows an image of a slender crystal observed 10 days after an amorphous Se film was mounted on a holey Cu film. The image in A matches with a calculated image shown in Fig. 2a. The calculation was carried out for a CuSe crystal (P63/mmc, a=0.394, c=1.725 nm) 20 nm thick, with the a-axis relatively tilted at 1° about the [012] axis to the incident electron beam, at an underfocus of Δf=50 nm. The optical diffractogram from the image of the area A was used for the calibration of the distance in the optical diffractograms from the other areas B∼ E. The crystal in B formed before the formation of the CuSe crystal.
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