Abstract
The monoclinic diopside structured CaMgGe2O6 dielectric ceramics were synthesized by the traditional solid-phase reaction method, and their microwave dielectric properties were characterized. X-ray diffraction (XRD) and Rietveld refinement revealed that CaMgGe2O6 belongs to the monoclinic system of space group C2/c. SEM images showed that dense CaMgGe2O6 ceramics could be formed at the optimum sintering temperature of 1300 °C. Typically, ceramic sintered at 1300 °C for 6 h possessed outstanding microwave dielectric properties with εr ∼7.96, Q × f ∼41,280 GHz, and τf ∼ −46.6 ppm/°C. Far-infrared spectra analysis revealed the intrinsic microwave dielectric properties of CaMgGe2O6 ceramics. These findings demonstrate promising application prospects of CaMgGe2O6 in microwave substrate materials.
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