Abstract
The crystal structure of tetrafluoro(1,10-phenanthroline-N,N')silicon acetonitrile semisolvate, [SiF4(phen)]·1/2CH3CN (I), was studied by X-ray diffraction analysis. The structure of I is tetragonal (space group I41/a; a=9.184(1), c=29.700(5) A, Z=8); direct methods, full-matrix least-squares refinement in an anisotropic approximation; R=0.039 for all 1820 independent reflections collected (CAD-4 automatic diffractometer, MoKα). The geometrical parameters of the [SiF4(phen)] molecule (bond lengths and angles, etc.) were determined with a high accuracy.
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