Abstract
It was reported that the two-stage image processing technique based on the combination of high resolution electron microscopy and electron diffraction is useful for the ab initio crystal structure determination [1]. In the first stage the image taken at an arbitrary defocus condition is transformed into the structure image by image deconvolution [2, 3]. The resolution of such obtained structure image is limited by the resolution of the electron microscope so that not all atoms but usually only heavy atoms can be seen. In the second stage the image resolution is improved by phase extension using the corresponding electron diffraction data [4].
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