Abstract
Powder X-ray diffraction measurements were taken in the R2-xCexCuO4-δ (R=Pr, Nd, Sm, Eu and Gd) system. Rietveld refinement of these structures was performed assuming that the space group was 14/mmm. The lattice constant and rare earth metal location were determined to study the electrostatic effects of T'-phase materials. We found that the difference in the Madelung site potential, ΔV (VR-VCu), as well as Tc has a peak for the Cu-O bond length. These data suggest that the carrier concentration is not constant in T'-phase materials and that changes in the carrier concentration influence Tc in these materials.
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