Abstract

The majority of industrial catalysts are high-surface-area solids, onto which an active component is dispersed in the form of nanoparticles that have sizes of between 1 and 20 nm. In an industrial environment, the crystal size distributions of such particles are conventionally measured by using either bright-field transmission electron microscope (TEM) images or X-ray diffraction. However, the analysis of particle sizes and shapes from two-dimensional bright-field TEM images is affected by variations in image contrast between adjacent particles, by the difficulty of distinguishing the particles from their matrix, and by overlap between particles when they are imaged in projection. High-angle annular dark-field (HAADF) electron tomography provides a convenient technique for overcoming many of these problems, by allowing the three-dimensional shapes and sizes of high atomic number nanoparticles that are supported on a low atomic number support to be recorded. Here, we discuss the three-dimensional analysis of particle sizes and shapes from such tomographic data, and we assess whether such measurements provide different information from that obtained using two-dimensional TEM images and X-ray diffraction measurements.

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