Abstract
A high resolution X-ray diffraction technique has been employed on annealed single crystals of aluminum in order to arrive at an estimate of dislocation densities and distributions. This work indicates that in annealed aluminum crystals the majority of the dislocations are present in an essentially random array with densities of the order of 106 lines/cm2. Small-angle boundaries, which are commonly present, contribute about 104 to 105 lines/cm2 to the dislocation density. Comparison of crystals obtained by growth from the melt and by recrystallization indicates that there are no basic differences in the degree of crystal perfection obtained using the two methods of growth.
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