Abstract
Single crystals of bismuth tellurite (Bi2TeO5) were grown by a double crucible Czochralski method at different pulling and rotation rates, ranging from 0.1mm/h to 0.8mm/h and from 5rpm to 20rpm, respectively. The crystallized phase was verified by X-ray diffraction measurements, occurring structural defects were characterized, and the growth conditions were studied being determined the better parameters to growth good-quality single crystals with uniform pale yellow coloration. Optical band gap of 3.1eV was determined from the optical transmission spectrum.
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