Abstract
The application of a crystal-dithering technique to the spectral phase interferometry for direct electric-field reconstruction (SPIDER) was experimentally demonstrated. Applying a crystal-dithering technique to SPIDER resulted in the improvement of the measurement sensitivity. In our approach, a 20μm-thick nonlinear crystal for a thin-crystal SPIDER method was replaced by a 100μm-thick crystal, and the crystal was dithered. The improvement was confirmed by comparing the statistical error of the crystal-dithering SPIDER to the statistical error of the thin-crystal SPIDER method. The dispersion of a BK7 plate was investigated to evaluate the reliability of the proposed approach.
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