Cryo-XPS – A new technique for the quantitative analysis of the structure of electric double layer at colloidal particles?

Abstract

There is a long-lasting uncertainty as to the structure of the metal oxide/water interface. Various structures have especially been invoked to rationalize the seemingly anomalous silica/water interface. But, none of them seems to be approved in a quantitative and systematic way. We show that the concentration ratio of monovalent counterions and coions around colloidal silica spheres, as detected by the cryo-XPS technique, follows fundamental theoretical predictions of either Boltzmann or Donnan distribution. It is suggested that the reason of the dual response is the formation of the swelling gel layer on the silica surface due to its longer contact with water.