Cross‐Section Analysis of the Composition of Sprayed Cu2ZnSnS4 Thin Films by XPS, EDS, and Multi‐Wavelength Raman Spectroscopy

Abstract

A detailed cross‐section analysis of the chemical composition of sprayed Cu2ZnSnS4 thin films is presented. X‐ray diffraction (XRD), energy dispersive spectroscopy (EDS), X‐ray photoelectron spectroscopy (XPS), and Raman spectroscopy (with near‐IR, visible, and UV‐lasers) are used to demonstrate that while CZTS effectively forms within the bulk of the film, there is some degree of element segregation, formation of undesirable secondary phases, and the presence of a disordered kesterite structure across the film. Different penetration depths of the excitation signals correspond to the many different surface sensitive techniques employed in this work. XPS results reveal that the surface of Cu4ZnSnS4 (CZTS) films presents a high concentration of tin and zinc and a low sulfur concentration, while being highly depleted in copper. EDS, XRD, and infrared Raman spectroscopy confirm that the composition of as‐sprayed and sulfurized films is close to stoichiometric Cu2ZnSnS4. Resonant UV‐Raman spectroscopy helps to identify secondary phases located at the external surface of sprayed and sulfurized CZTS films (mainly ZnS, ZnO), while VIS‐Raman spectroscopy helps to identify a disordered kesterite structure close to the surface. Secondary phases need to be chemically etched when aiming at incorporating kesterite films obtained by spray pyrolysis into photovoltaic devices.