Cross-tie walls and magnetic singularities on the surface of permalloy films (abstract)

Abstract

An understanding of the surface magnetic microstructure of thin polycrystalline permalloy films is important for the development of improved magnetoresistive sensors. Scanning electron microscopy with polarization analysis (SEMPA) was used to image the surface magnetic domain structure of permalloy films in ultrahigh vacuum. The SEMPA system uses a compact Mott electron spin polarimeter with a Th foil (operating at 25 keV) that has been attached to the back of a hemispherical energy analyzer. Two orthogonal in-plane components of the electron spin polarization were measured to obtain magnetic domain images with excellent contrast. 350 Å Ni83Fe17 films, deposited by Honeywell-Micro Switch using dc magnetron sputtering, were studied. The samples were demagnetized along the easy axis by an ac magnetic field with decreasing amplitude. Using SEMPA, zigzag domain walls separating two large approximately head-on domains were observed. Cross-tie walls were observed with a periodic vortex structure along the straight edges of the zigzag domain walls. The cross-tie walls occur at the points where the magnetization is reversed by 180° across the straight edges of the wall. At high magnification, the elliptical and hyperbolic singularities at the cross-tie walls were clearly observed. In addition, the Néel part and the Bloch part of the cross-tie were distinguished This is a detailed study of cross-tie walls on sputter deposited thin permalloy films using SEMPA and our results are in good agreement with theoretical calculations.