Abstract

The results of calculating the moduli of the coefficients of the electromagnetic wave reflection matrix (EMW) at the boundary of an inhomogeneous anisotropic medium with torsion using the matrix form of the Wentzel-Kramers-Brillouin (WKB) method are presented. The effect of the orientation of the optical axis and the torsion angle on the polarization of the waves propagating in the medium and on the off-diagonal coefficients of the reflection matrix is shown.

Highlights

  • There is an intensive development of optoelectronics and nanophotonics

  • Liquid crystals are often used as materials for the new elemental base of photonics

  • The Wentzel– Kramers–Brillouin (WKB) method [9] allows us to find a solution for a medium with gradient parameters [10]

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Summary

Introduction

There is an intensive development of optoelectronics and nanophotonics. For the development of new highly efficient optoelectronic devices: solar cells, nanodirectional devices, sensing, imaging, ultra-high resolution [1] materials that have unusual properties are used. Liquid crystals are often used as materials for the new elemental base of photonics. The variety of their properties and variability in the application of external fields [6] allow them to be used for new optical solutions. To calculate the fields in planar structures, researchers traditionally use a model of a layered medium In this model, an inhomogeneous layer is represented as a set of layers with uniform parameters. The 4x4 matrix form for the Wenzel–Kramers–Brillouin method is used to calculate the coefficients of the light reflection matrix at the boundary of an inhomogeneous anisotropic liquid crystal with a variable direction of the optical axis

Optical properties of an anisotropic medium
Basic equations
Reflection matrix
Conclusions
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