Abstract
A provisional setup for X-ray microprobe experiments at 35 keV is described. It is based on compound refractive lenses (CRLs) for nanofocusing and a Vortex silicon drift detector with 2 mm sensor thickness for increased sensitivity at high energies. The Microprobe experiment (PETRA III) generally uses Kirkpatrick-Baez mirrors for submicrometer focusing in the energy range of 5–21 keV. However, various types of scanning X-ray microscopy experiments require higher excitation energies. The CRL optics were characterized by X-ray ptychography and X-ray fluorescence (XRF) knife edge scans on a siemens star pattern and showed beam sizes down to 110 nm. The performance of the new setup for microscopic X-ray diffraction (XRD)–XRF scanning X-ray microscopy measurements at 35 keV is demonstrated on a cross-section of a painting fragment.
Highlights
Various sample environments like cryostreams, cryogenic sample chambers, chemical reactors, diamond anvil cells, and other user supplied equipment
Phase plate-corrected compound refractive lenses (CRLs) optics at 35 keV were characterized by ptychography and X-ray fluorescence (XRF) edge scans on a siemens star pattern
The performance of the new high-energy setup for microscopic X-ray powder diffraction (XRD)–XRF scanning X-ray microscopy measurements is demonstrated on a cross-section of a painting fragment
Summary
Various sample environments like cryostreams, cryogenic sample chambers, chemical reactors, diamond anvil cells, and other user supplied equipment. The recent innovation of phase plates for the aberration correction of X-ray optics (Seiboth et al, 2017) made the application of compound refractive lenses (CRsL) attractive as the complementation of the KB system for focusing down to 100 nm beamsize at intermediate energies (8–20 keV) (Schropp et al, 2018). The high-energy microprobe setup was initiated for scanning (powder) X-ray diffraction studies of highly absorbing (paint-) samples and K-edge XRF measurements of heavier elements from silver to iodine in bio-medical applications, but attracted interest for applications in materials sciences and catalysis research. Phase plate-corrected CRL optics at 35 keV were characterized by ptychography and XRF edge scans on a siemens star pattern. The performance of the new high-energy setup for microscopic X-ray powder diffraction (XRD)–XRF scanning X-ray microscopy measurements is demonstrated on a cross-section of a painting fragment
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