Abstract
We investigate the melting behavior of Au/Ge bilayer (Ge: 5 or 2nm; Au: 0.1–1.1nm) thin films using transmission electron microscopy and high energy electron diffraction. It was found that the liquid-phase formation in the system at eutectic temperature takes place only if the gold film mass thickness values are greater than the critical one (0.2nm). This effect is revealed to be independent of the contact-heating sequence of the components.
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