Abstract
X-ray diffraction analysis of sintered porous anodes of solid tantalum capacitors and the current-voltage (I–V) characteristics of Ta2O5 amorphous layers formed on the anode surface have been performed. A strong correlation between a sharp increase of direct current in the I–V characteristics at some critical oxygen content and the creation of a saturated solid-phase solution of oxygen in tantalum was found. The appearance of a crystalline oxide Ta2O5 phase was detected in porous anodes at oxygen contents above the critical oxygen level. The decrease of effective radius below 1 μm of Ta powder particles used in sintering leads to the size effect: the oxygen content in the porous anode after sintering exceeds the solubility limit. © 1998 Kluwer Academic Publishers
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More From: Journal of Materials Science: Materials in Electronics
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