Abstract
As the number and variety of ceramic materials have grown so rapidly in the last few decades, ranging from silicon nitride structural ceramics to the perovskite superconductors to the ferroelectric oxides to semiconducting sensors, the number of scientific and technical issues has also grown rapidly. Many of the basic questions relate to the role the microstructures play in determining the observed physical behavior but increasingly it is not the geometric properties of the microstructure that are of central concern but rather compositional variations and associated electrical characteristics. These require the continued development of microscopy techniques to complement the tremendous advances in microstructural understanding that have already been made possible by microscopy in the past.Since the role of microscopy is such a broad one, only a few of the most generic problems in microstructure characterization will be described in this talk. The topics selected include the characterization of intergranular films in liquid-phase sintered ceramics, the charge distribution at interfaces and the associated space charge, the epitaxial growth of oxides on oxide substrates, and the use of fluorescence imaging to identify phases and non-destructively measure local strains.
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