Abstract
Nb-Ta multilayered films prepared by magnetron sputtering have been studied by critical-field measurements. We have examined the effects of substrate orientation and deposition temperature on the properties of the films. Three-dimensional to two-dimensional crossover is observed. For films with larger Nb layer thicknesses an additional transition in ${H}_{c2?}$ at lower temperatures is observed which cannot be accounted for by the interfacial regions.
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