Critical current properties in high-temperature superconducting wires and tapes

Abstract

The hot topics of the critical current properties in YBCO coated conductors and Bi-2223 silver-sheathed tapes are discussed. The dependence of the critical current density in YBCO coated conductors on the superconducting layer thickness is partly associated with the defects nucleated in thicker films and is also caused by the thickness dependent influence of the flux creep. Experimental results on PLD processed conductors with different thicknesses are compared with the theoretical analysis based on the flux creep-flow model. A discussion will also be given for the optimum layer thickness for applications.In Bi-2223 tapes introduction of CT-OP (ConTrolled Over Pressure) process has significantly improved the critical current properties. This progress can be attributed to the improvement of the mean value of the flux pinning strength and the decrease in its distribution width. The possibility of further improvement of the critical current properties is discussed using the flux creep-flow model.