Critical current density measurement of striated multifilament-coated conductors using a scanning Hall probe microscope

Abstract

In this paper the authors succeeded in measuring the critical current density () of multifilament-coated conductors (CCs) with thin filaments as low as 0.25 mm using the scanning hall probe microscope (SHPM) technique. A new iterative method of data analysis is developed to make the calculation of for thin filaments possible, even without a very small scan distance. The authors also discussed in detail the advantage and limitation of the iterative method using both simulation and experiment results. The results of the new method correspond well with the traditional fast Fourier transform method where this is still applicable. However, the new method is applicable for the filamentized CCs in much wider measurement conditions such as with thin filament and a large scan distance, thus overcoming the barrier for application of the SHPM technique on measurement of long filamentized CCs with narrow filaments.