Critical Current Density and Flux Penetration Behavior of Y123 LPE Thick Films

Toshiaki Takagi,Takato Machi,Naoki Koshizuka,Jian-Guo Wen,Kaname Matsumoto,Kenji Hashimoto,Tadataka Morishita

doi:10.1007/978-4-431-66879-4_149

Critical Current Density and Flux Penetration Behavior of Y123 LPE Thick Films

Toshiaki Takagi, Takato Machi + Show 5 more

https://doi.org/10.1007/978-4-431-66879-4_149

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Publication Date: Jan 1, 1998

Citations: 1

Affiliation: International Superconductivity Technology Center

#Current Density Of Films #Magneto-optical Imaging Technique + Show 8 more

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Abstract

We report on the flux penetration behaviors of Y123 thick films grown by LPE method on MgO substrates. A typical critical current density of the films is 1.3 × 104 A/cm2 at 77K and 6T. This value is comparable or higher than that of films grown by pulsed laser deposition (PLD) method. Flux penetration along twin boundaries is observed at 5K by using the magneto-optical imaging technique. This indicates that the twin boundaries in the Y123 films work as weaklinks at least at low temperatures.

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