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Abstract
The question of critical current reduction across 45° misoriented grain boundaries was addressed in this study. The reduction in J c for a polycrystalline c-axis perpendicular film with complete and partial in plane a-axis texturing was calculated using a limiting-pathe model. The numerical results were then compared to experimental results obtained with YBCO on YSZ substrates, which had a particular texturing that is most suited for this study. The results indicated that the J c reduction was not so large as indicated in the bicrystal studies of Dimos et al.
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