Abstract
Abstract We have measured the temperature and magnetic field dependence of the critical current densities in highly textured BiSrCaCuOxide thin films. The samples measured were either nearly single phase Bi 2 Sr 2 CaCu 2 O 8 or a mixture of Bi 2 Sr 2 CaCu 2 O 8 and Bi 2 Sr 2 Ca 2 Cu 3 O 10 . The zero-field critical current density increased almost linearly with decreasing temperature for both types of samples, reaching approximately 5×10 4 A/cm 2 at 4.2K. At 4.2K the critical current density was > 10 4 A/cm 2 even in fields of 6.7 kOe. However, the current carrying capacity of both types of samples was easily destroyed at 77K by application of fields of only a few hundred Oe perpendicular to the copper-oxide planes. Critical current densities were much less sensitive to field at both 4.2K and 77K when the field was applied parallel to the copper-oxide planes.
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