Abstract

In this paper, we have investigated the Ic degradation behaviours in Ag alloy sheathed Bi-2223 superconducting tapes under bending and torsion strains. In particular, we have examined the homogeneity of Ic degradation along the longitudinal direction of tapes by adopting multiple voltage terminals. The bending modes influenced the Ic degradation behaviour in Bi-2223 tapes. A gradual and consistent decrease of Ic could be observed at all sections, which was a different behaviour from that under tensile loading. Up to εirr, Ic showed a nearly similar degradation at each section, due to a simultaneous initiation of cracks from defects indicating that uniform deformation occurred in tapes with bending. Over εirr, some variations in the Ic degradation occurred due to the difference of crack growth rates at each section. In particular, the behaviour appeared significantly with hard bending. The degradation of Ic in Bi-2223 tapes by torsion occurred gradually when the torsion angle exceeded 150°. However, the Ic degradation by torsion strain was small compared with other types of loading. Also, the Ic degradation behaviour at each section along the longitudinal direction of tapes was gradual and consistent, representing a uniform torsional deformation in the tapes.

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