Abstract
In the case of 2G coated conductor (CC) tapes, it has been reported that thin–thick CC tapes with IBAD substrate showed a superior electromechanical property even at smaller bending radius compared with the cases of 1G BSCCO tapes. Considering the application of CC tapes it is significant to evaluate the transport property under operating environment, because CC tapes might experience a change in operating pressure that can affect its current carrying capacity due to temperature variation and deformation. This study was focused on the Ic degradation behavior in bent CC tapes under pressurized liquid nitrogen. Differently processed YBCO and SmBCO CC tapes with IBAD substrate are used as samples. The bending strain characteristics at elevated pressure levels were evaluated by using the ρ-shaped sample holder which can induce different bending strain values at pressured state. Depressurization and thermal cycling were performed to check the reversibility of Ic in CC tapes. Vacuuming tests were also carried out to investigate the characteristics of Ic at different LN2 temperature levels.
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