Critical Compilation of Surface Structures Determined by Surface Extended X-Ray Absorption Fine Structure (SEXAFS) and Surface Extended Electron Energy Loss Spectroscopy (SEELFS)

Abstract

This review critically compiles all surface structures derived by the technique of surface extended x-ray absorption fine-structure spectroscopy (SEXAFS) and surface electron energy loss fine-structure spectroscopy (SEELFS) reported in the refereed literature prior to January 1990. They are compared with the extensive low-energy electron diffraction (LEED) [P. R. Watson, J. Phys. Chem. Ref. Data 16, 953 (1987)] and ion scattering databases [P. R. Watson, J. Phys. Chem. Ref. Data 19, 85 (1990)] previously reported. The important experimental and theoretical aspects of such investigations have been extracted into easily understood tabular form supplemented by many figures and ancillary tables and complete references. It is hoped that this compilation will provide a valuable resource both for the surface science specialist and for those nonspecialists in other areas who need surface crystallographic data.