Abstract
Partial-wave phase shift scattering cross sections are employed to evaluate expressions in a criterion, originally suggested by Rode and Knight (1971) for estimating the importance of multi-ion scattering in semiconductor free electron transport. When the screening length is much longer than the electron wavelength, multi-ion scattering is predicted to be less important than is implied by the calculations of Moore (1967) and of Arbuzov and Evdokimov (1979). Moreover, the results of those theories are shown to be misleading in that regime since they are based on the low-order termination of slowly converging expansions. Also discussed is a criterion for the importance of collision-broadening effects. These considerations appear to explain adequately why mobilities recently obtained from a single-site phase shift calculation agree well with experiment in some cases, but not in others.
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