Abstract
Extended interaction oscillators (EIOs) are high-frequency vacuum-electronic sources, capable to generate millimeter-wave to terahertz (THz) radiations. They are considered to be potential sources of high-power submillimeter wavelengths. Different slow-wave structures and beam geometries are used for EIOs. This paper presents a quantitative figure of merit, the critical unloaded oscillating frequency ( ${f}_{\textsf {cr}} $ ) for any specific geometry of EIO. This figure is calculated and tested for $2\pi $ standing-wave modes (a common mode for EIOs) of two different slow-wave structures (SWSs), one double-ridge SWS driven by a sheet electron beam and one ring-loaded waveguide driven by a cylindrical beam. The calculated ${f}_{\textsf {cr}}\text{s}$ are compared with particle-in-cell (PIC) results, showing an acceptable agreement. The derived ${f}_{\textsf {cr}}$ is calculated three to four orders of magnitude faster than the PIC solver. Generality of the method, its clear physical interpretation and computational rapidity, makes it a convenient approach to evaluate the high-frequency behavior of any specified EIO geometry. This allows to investigate the changes in geometry to attain higher frequencies at THz spectrum.
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