Abstract
Abstract Creep tests have been carried out on AlSiCu alloy thin foils with thicknesses of 10 and 30 μm at 200°C. The results obtained have been assessed in comparison with those previously obtained on foils with thicknesses ranging from 50 to 100 μm. In the present study, the creep rate obtained in the thickness range under 50 μm decreases with decreasing specimen thickness, as opposed to the previously obtained dependence of creep rate on specimen thickness in the thickness range from 50 to 100 μm. Texture of specimens with thicknesses ranging from 10 to 100 μm has been examined using X-ray diffraction. The textural components change with the specimen thickness in the range below 50 μm. This being combined with the difference in Taylor factor of each component, is presumed to explain the different dependence of creep rate on specimen thickness in the thickness range below 50 μm.
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