Abstract
In educational measurement, the construction of parallel test forms is often a combinatorial optimization problem that involves the time-consuming selection of items to construct tests having approximately the same test information functions (TIFs) and constraints. This article proposes a novel method, genetic algorithm (GA), to construct parallel test forms effectively. The sum of squared errors of the generated TIFs produced by GA were compared with those of the Swanson and Stocking method, and the Wang and Ackerman method. Experimental results show that tests constructed using GA yielded lower error, and an average improvement ratio above 90%.
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