Abstract
The crack susceptibility curves (crack susceptibility vs. solute content Co) of binary Al alloy systems were calculated by plotting the maximum | dTld(fs) 112 | vs. C o , where T is temperature, fs fraction solid, and the maximum | dTld(fs) 112 | a crack susceptibility index proposed and verified recently. Two simple equations were derived based on binary phase diagrams with straight solidus and liquidus lines to calculate the location (C o ) peak and height | dTld(fs) 112 | peak of the peak of the crack susceptibility curve without having to calculate the curve first. The effect of the eutectic line, liquidus line and solidus line of a eutectic phase diagram on the crack susceptibility was demonstrated. First, | dTld(fs) 112 | peak tends to decrease when the eutectic line is raised, the liquidus line steepened, or the solidus line made shallower. Second, back diffusion tends to increase (C o ) peak and decrease | dTld(fs) 112 | peak . These tendencies agreed with the two equations and with the reported crack susceptibility of Al-Si and Al-Mg alloy systems.
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