Abstract
In this study, double exponential model is established to investigate the central crack problem for a functionally graded superconducting film with filed dependent critical current. The stress intensity factors (SIFs) are analytically obtained and numerically calculated. Numerical results show the effects of applied magnetic field, model parameters, and crack length on the SIFs. Among others, in the process of field descent, the crack in the superconducting film easily propagates in the mode-I form. Increasing the graded parameter of shear modulus can inhibit crack propagation. For a fixed reduced field (especially for a larger magnetic field), both the mode-I and mode-II SIFs firstly increase, then decrease with the increasing of introduced non-dimensional exponent parameter. This study should be useful for the application of superconducting devices.
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