Abstract

The use of ultrasonic arrays to characterize defects is an important area in non-destructive evaluation. In this paper, the scattering coefficient calculation model of the defect is built by using subarray transmitter-receiver pair. Then an approach of crack like defect characterization based on the scattering coefficient distribution is developed in the light of study on the relationship between scattering coefficient and direction of defect. The full focusing image from the full matrix capture data obtained to determine the location of the defect. Then, scattering coefficient distribution was deduced to extract the information on the crack like defect orientation by dividing the linear array into a certain number of subarrays. Results in simulation show that the crack like defect characterization method is effective.

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