Abstract
The cover shows a bending test on a Cu single crystal nanowire. The distribution of the geometrically necessry dislocations in the bent wire was determined using high resolution electron back scatter diffraction and predicted using a crystal plasticity finite element method which uses a dislocation based constitutive law. More details can be found in the article of F. Weber, I. Schestakow, F. Roters, D. Raabe on page 737.
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