Abstract
We present first results of the combination of imaging photoemission electron spectroscopy with imaging mass spectrometry. Imaging NEXAFS was combined with TOF-SIMS in order to perform a spatially resolved chemical and isotopic analysis of microscopic grain samples. Imaging NEXAFS was used for the nondestructive lateral characterization of mineral phases prior to isotopically resolved mass analysis by imaging TOF-SIMS. This novel approach was demonstrated by performing a chemical and isotopic analysis of the rare presolar grain fraction present in the Murchison meteorite.
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