Abstract
We study the electromagnetic coupling mechanism of a Tl2Ba2CaCu2O8 (Tl-2212) thin film intrinsic Josephson junction to a hemispherical Fabry—Perot resonator. An effective model to analyze coupling mechanism is put forward. The dielectric substrate is used as a dielectric resonator antenna and the Josephson junction, and a superconducting film is used as the feed line to excite a resonance mode inside the dielectric resonator antenna. To confirm this method, two Josephson junction samples with different dimensions of substrate and shapes of superconducting film are fabricated and tested under microwave irradiations. At the same time, numerical simulations of the antenna characteristics and the field distribution of these samples are performed by numerical simulation. The different coupling intensities of the two samples with the Fabry—Perot resonator fit well with the numerical simulation results. The proposed model is important for Josephson junctions used in the microwave field.
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