Abstract
Correlative light and electron microscopy (CLEM) is emerging as a powerful tool for nanoscale structural studies. Challenges arise when obtaining precisely registered images of nanoscale neighborhoods within the same sample with multiple microscopes. This severely limits experimental throughput and precludes quantitative assessment of heterogeneous samples. We have developed indirect CLEM [iCLEM] as a low-cost, high throughput option with extensive quantitative capabilities. iCLEM leverages the high imaging throughput of confocal microscopy, STORM single molecule localization microscopy, and transmission electron microscopy (TEM) and exploits structural fiducials / landmarks identifiable via both light and electron microscopy to correlate measurements.
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