Abstract
In this paper, we present an efficient coupled-wave surface-impedance method for the analysis of extraordinary optical transmission (EOT) through single and stacked realistic metallic screens under normal and oblique incidence, including possible dielectric interlayers. The proposed theory is valid for the complete frequency range where EOT has been reported, including microwaves and optics. Electromagnetic simulations validate the results of the model, which enable fast and accurate characterization of the analyzed structures.
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