Abstract
Using the high-resolution electron energy-loss spectroscopy technique (HREELS), we have probed ultra-thin films of silver deposited under UHV conditions onto a clean silicon (111) substrate displaying a (7 × 7) superstructure. Coupled interface plasmons of the Ag layer with its adjacent media (vacuum and Si) have been clearly observed. The dispersion of these interface plasmons has been plotted versus q| D where q| where q| is the wavevector transfer and D is the Ag layer thickness. The experimentally found dispersion behaviour can be understood within the dielectric theory applied to a two interfaces-bounded layer.
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