Abstract

A coupled deep learning approach for coded aperture design and single-pixel measurements classification is proposed. A whole neural network is trained to simultaneously optimize the binary sensing matrix of a single-pixel camera (SPC) and the parameters of a classification network, considering the constraints imposed by the compressive architecture. Then, new single-pixel measurements can be acquired and classified with the learned parameters. This method avoids the reconstruction process while maintaining classification reliability. In particular, two network architectures were proposed, one learns re-projected measurements to the image size, and the other extracts small features directly from the compressive measurements. They were simulated using two image data sets and a test-bed implementation. The first network beats in around 10% the accuracy reached by the state-of-the-art methods. A 2x increase in computing time is achieved with the second proposed net.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.