Abstract

This work presents stochastic approaches to model the counting behavior of actively quenched single-photon avalanche diodes (SPADs) subjected to continuous-wave constant illumination. We present both analytical expressions and simulation algorithms predicting the distribution of the number of detections in a finite time window. We also present formulas for the mean detection rate. The approaches cover recovery time, afterpulsing, and twilight pulsing. We experimentally compare the theoretical predictions to measured data using commercially available silicon SPADs. Their total variation distances range from $10^{-5}$ to $10^{-2}$.

Highlights

  • This work presents stochastic approaches to model the counting behavior of actively quenched single-photon avalanche diodes (SPADs) subjected to continuous-wave constant illumination

  • We compared our predictions with the counting statistics of three different actively quenched silicon SPAD modules made by two manufacturers (Excelitas SPCM CD3605H and CD3432H, Laser Components Count 20 C)

  • Each SPAD was subjected to a pulsed signal coming from an attenuated gain-switched VCSEL diode (850 nm)

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Summary

Introduction

This work presents stochastic approaches to model the counting behavior of actively quenched single-photon avalanche diodes (SPADs) subjected to continuous-wave constant illumination. We present both analytical expressions and simulation algorithms predicting the distribution of the number of detections in a finite time window. S INGLE-PHOTON avalanche diodes (SPADs) are the most affordable and widespread technology for detecting photons in the field of quantum optics [1], [2]. An incident photon excites an electron-hole pair that causes a rapidly increasing current avalanche. Color versions of one or more of the figures in this article are available online at http://ieeexplore.ieee.org

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