Abstract

We study the effect of spin Coulomb drag on the magnetoresistance and the spin-current injection efficiency of a layered structure consisting of a nonmagnetic semiconductor sandwiched between two ferromagnetic electrodes of spin polarization p. The calculations are done within the framework of the drift–diffusion theory, which we generalize to include the spin trans-conductivity σ ↑↓. We find that for p close to 100% the spin drag enhances the magnetoresistance, while for smaller values of p it reduces it. A new approach to the measurement of σ ↑↓ is suggested.

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