Abstract
The introduction of the high performance T <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> L device technology for the IBM 4300 Systems and the System/38 required extensions of the 24-mm metallized ceramic module used in prior IBM systems. The extension of the metallized ceramic technology into a physically larger 28-mm module, electrically enhanced with a reference plane and with fine line (0.025-mm) wiring, is described. The reliability of this module was evaluated with particular emphasis on corrosion and metal migration in humid environments and on exposure to atmospheric contaminants.
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