Abstract

Thin films of hafnium oxide were deposited by electron beam evaporation. The effects of the film thickness and preparation conditions (films prepared on the heated substrate with or without the presence of oxygen environment during deposition) on the optical and carbon monoxide sensing properties of the films were studied. The films were characterized using X-ray diffraction and X-ray photoelectron spectroscopy and optical spectroscopy techniques. Films deposited on unheated substrates were amorphous, whereas those deposited on heated substrates showed a mixture of amorphous and polycrystalline structure. It was found that the sensitivity of the films to CO increased with the thickness and the porosity (as reflected by the refractive indices) of the films.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call