Abstract
Because the interference is not considered, formula (4) in this Communication is not really applicable for the deff estimation of the hybrid metal halide thin film. In this case, Lr and Ls should be the coherent lengths of Y-cut quartz and sample, respectively. Supposing that the strict phase-matching requirement is not satisfied, the coherent length difference between Y-cut quartz and sample can be neglected.1 As a result, deff of the chiral (R-MBA)2CuCl4 film is determined to be approximately 0.35 pm V−1. It is noteworthy that the value is an estimation on the order of magnitude. The Corrigendum will not affect the main conclusions of this Communication, and the authors appreciate a reader for making them aware of these issues.
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