Abstract
The correlation between surface domain structure (SDS) and high frequency magneto-impedance (MI) in amorphous microwires has been systematically studied. First, we applied the magneto-optical polarizing microscopy to determine the SDS and found that it is considerably different in unstressed microwire and in microwires to which tensile and torsional stress were applied. Then, we measured the longitudinal and off-diagonal MI in these microwires and also observed quite different MI dependencies. We analyzed the experimental MI curves and their dependence on the SDS with the help of a simple model that nevertheless yields good qualitative agreement with experiment. We have demonstrated that the analysis of the MI dependencies, especially the off-diagonal one, can reveal the SDS in the microwires. The obtained results can also be useful for magnetic and stress sensing applications.
Published Version
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