Abstract
Stress in Cr and CoCrPt/Cr films grown on smooth and lithographically textured silicon substrates were studied to investigate the origins of magnetic anisotropy in grooved longitudinal magnetic recording media. Crystallographic texture changes from Cr(110) to Cr(200) orientations are correlated with large stress changes. Magnetostrictive effects due to stress anisotropy in grooved samples are explored.
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