Abstract
We have used low-temperature photoluminescence (PL) spectroscopy and room-temperature photoluminescence mapping as a measure of composition variation in cadmium zinc telluride grown by high-pressure Bridgman. We have correlated the uniformity, as measured by the line width of the bound exciton peak in the low-temperature spectrum and the degree of variation in the peak position in the room-temperature map, with the peak-to-valley ratio of the 59.5 keV photopeak in the pulse-height spectrum of /sup 241/Am. For detectors having active areas of 10-30 mm/sup 2/, the PL measurements can be combined with resistivity measurements to give a strong predictor of detector performance. For arrays of 1 mm diameter detectors, the correlation between these material parameters and detector performance is much weaker. Our measurements show that material parameters and detector performance can vary substantially between points on a 1 cm/sup 2/ sample.
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